Best Conference Paper Award
Description: To recognize the most outstanding paper presented at the annual IEEE International Workshop on Metrology for AeroSpace.
Basis for Judging: Technical merit, originality, potential impact on the field, clarity of the written paper, and quality of the oral or other presentation.
Best Paper Presented by a Young Researcher
Description: An exclusive plaque will be given for the best paper authored and presented by a researcher younger than 35 years in age.
Basis for Judging: Technical merit, originality, potential impact on the field, clarity of the written paper, and quality of the oral or other presentation.
Best Paper Presented by a Woman
Description: An exclusive plaque will be given for the best paper authored and presented by a woman.
Basis for Judging: Technical merit, originality, potential impact on the field, clarity of the written paper, and quality of the oral or other presentation.
Best Radar Paper Award
Description: To recognize the most outstanding paper presented at the annual IEEE International Workshop on Metrology for Aerospace as part of the Special Session on Metrology for Radar Systems.
Basis for Judging: Technical merit, originality, potential impact on the field, clarity of the written paper, and quality of the oral or other presentation.
Best Paper of the Poster Session
Description: An exclusive plaque will be given for the best poster presented.
Basis for Judging: Technical merit, originality, potential impact on the field, clarity of the written paper, and quality of the poster presentation.
Best Demo
Description: To highlight the importance of the Demo Session, an exclusive plaque will be given for the best demo.
